Hiroyuki Fukiwara eBooks
eBooks found: 1
Spectroscopic Ellipsometry: Principles and Applications
Wiley, December 2007
ISBN: 9780470016084
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry >>
eBook price:
$200.00












.jpg)





