Logic-Level Testing and Defect Characterization : Chapter 5 from Design & Test of Digital Circuits by Quantum-Dot Cellular Automata PDF (Adobe DRM) download by J. Huang

Logic-Level Testing and Defect Characterization : Chapter 5 from Design & Test of Digital Circuits by Quantum-Dot Cellular Automata

Artech House Publishers
Publication date: October 2007
ISBN: 9781607831860
Digital Book format: PDF (Adobe DRM)

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Chapter 5 from Design and Test of Digital Circuits by Quantum-Dot Cellular Automata, Fabrizio Lombardi, Jing Huang, Editors
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