Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ePub (Adobe DRM) download by Krishnendu Chakrabarty

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

CRC Press
Publication date: December 2017
ISBN: 9781351833707
Digital Book format: ePub (Adobe DRM)

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits ePub (Adobe DRM) download by Krishnendu Chakrabarty
CRC Press, December 2017
ISBN: 9781351833707
EAN:  9781351833707
ePub (Adobe DRM)
List Price: $80.00 eBook price: $74.99
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits PDF (Adobe DRM) download by Krishnendu Chakrabarty
CRC Press, December 2017
ISBN: 9781439829424
EAN:  9781439829424
PDF (Adobe DRM)
List Price: $80.00 eBook price: $74.99
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